{"id":501,"date":"2025-02-03T14:53:05","date_gmt":"2025-02-03T17:53:05","guid":{"rendered":"https:\/\/pages.cnpem.br\/xrm2026\/?page_id=501"},"modified":"2025-04-24T13:47:01","modified_gmt":"2025-04-24T16:47:01","slug":"about-xrm","status":"publish","type":"page","link":"https:\/\/pages.cnpem.br\/xrm2026\/about-xrm\/","title":{"rendered":"About XRM"},"content":{"rendered":"<div class=\"wpb-content-wrapper\"><p>[vc_row][vc_column][vc_column_text css=&#8221;&#8221;]<\/p>\n<p style=\"text-align: justify;\" data-ccp-props=\"{&quot;335551550&quot;:1,&quot;335551620&quot;:1,&quot;335559683&quot;:0,&quot;335559685&quot;:0,&quot;335559731&quot;:0,&quot;335559737&quot;:0,&quot;335562764&quot;:2,&quot;335562765&quot;:0.9,&quot;335562766&quot;:4,&quot;335562767&quot;:10,&quot;335562768&quot;:4,&quot;335562769&quot;:0}\"><span data-usefontface=\"false\" data-contrast=\"none\">The <strong>International Conference on X-ray Microscopy<\/strong> is the central conference of its community, attracting 300 to 400 scientists, engineers, and <\/span><span data-usefontface=\"false\" data-contrast=\"none\">industrialists in the field. It brings together experts in developing and using X-ray microscopes, imaging methods, and related techniques. This <\/span><span data-usefontface=\"false\" data-contrast=\"none\">conference addresses the most recent advances in X-ray microscopy technology as well as state-of-the-art applications in a wide range of <\/span><span data-usefontface=\"false\" data-contrast=\"none\">science disciplines through a program of lectures, communications, posters, exhibitors, and social interaction.<\/span>\u200b<\/p>\n<p style=\"text-align: justify;\" data-ccp-props=\"{&quot;335551550&quot;:1,&quot;335551620&quot;:1,&quot;335559683&quot;:0,&quot;335559685&quot;:0,&quot;335559731&quot;:0,&quot;335559737&quot;:0,&quot;335562764&quot;:2,&quot;335562765&quot;:0.9,&quot;335562766&quot;:4,&quot;335562767&quot;:10,&quot;335562768&quot;:4,&quot;335562769&quot;:0}\"><span data-olk-copy-source=\"MessageBody\">XRM is a unique forum for discussing the novel imaging and microscopy possibilities at synchrotron, X-ray free-electron laser, and laboratory sources, and promoting their applications to different scientific areas.<\/span>\u200b<\/p>\n<p style=\"text-align: justify;\" data-ccp-props=\"{&quot;335551550&quot;:1,&quot;335551620&quot;:1,&quot;335559683&quot;:0,&quot;335559685&quot;:0,&quot;335559731&quot;:0,&quot;335559737&quot;:0,&quot;335562764&quot;:2,&quot;335562765&quot;:0.9,&quot;335562766&quot;:4,&quot;335562767&quot;:10,&quot;335562768&quot;:4,&quot;335562769&quot;:0}\"><span data-usefontface=\"false\" data-contrast=\"none\">The series started in G\u00f6ttingen, Germany, in 1983, and the last one was held in Lund, Sweden, in 2024.<\/span><\/p>\n<p>[\/vc_column_text]<div class=\"standard-arrow list-divider bullet-top\"><ul>\n<li><strong>XRM I: G\u00f6ttingen, Germany. 1983<br \/>\n<\/strong>Proceedings:\u00a0<a href=\"http:\/\/link.springer.com\/book\/10.1007\/978-3-540-38833-3\" target=\"_blank\" rel=\"noreferrer noopener\">Schmahl, G., and Rudolph, D. (Eds.) (1984),\u00a0X-Ray Microscopy,\u00a0Springer.<\/a><\/li>\n<li><strong>XRM II: Brookhaven, NY. 1987<br \/>\n<\/strong>Proceedings:\u00a0<a href=\"http:\/\/link.springer.com\/book\/10.1007\/978-3-540-39246-0\" target=\"_blank\" rel=\"noreferrer noopener\">Sayre, D., Howells, M., Kirz, J., Rarback, H. (Eds.) (1988),\u00a0X-Ray Microscopy II,\u00a0Springer.<\/a><\/li>\n<li><strong>XRM III: London, UK. 1990<br \/>\n<\/strong>Proceedings:\u00a0<a href=\"http:\/\/link.springer.com\/book\/10.1007\/978-3-540-46887-5\" target=\"_blank\" rel=\"noreferrer noopener\">Michette, A., Morrison, G. R., and Buckley, C. J. (Eds.) (1992),\u00a0X-Ray Microscopy III,\u00a0Springer.<\/a><\/li>\n<li><strong>XRM IV:\u00a0Chernogolovka, Russia. 1993<br \/>\n<\/strong>Proceedings: Aristov, V. V., and Erko, A. I. (Eds.) (1994),\u00a0X-Ray Microscopy IV,\u00a0Chernogolovka, Russia.<\/li>\n<li><strong>XRM V: W\u00fcrzburg, Germany. 1996<br \/>\n<\/strong>Proceedings:\u00a0<a href=\"http:\/\/www.springer.com\/us\/book\/9783642721083%20\" target=\"_blank\" rel=\"noreferrer noopener\">Thieme, J., Schmahl, G., Rudolph, D., and Umbach, E. (Eds.) (1998),\u00a0X-ray Microscopy and Spectromicroscopy,\u00a0Springer.<\/a><\/li>\n<li><strong><a href=\"https:\/\/web.archive.org\/web\/20051118084438\/http:\/\/xrm99.lbl.gov\/\" target=\"_blank\" rel=\"noreferrer noopener\">XRM99<\/a>: Berkeley, CA. 1999<br \/>\n<\/strong>Proceedings:\u00a0<a href=\"http:\/\/scitation.aip.org\/content\/aip\/proceeding\/aipcp\/507%20\" target=\"_blank\" rel=\"noreferrer noopener\">Tony Warwick\u00a0,\u00a0Werner Meyer-Ilse\u00a0\u00a0and\u00a0David Atwood, Eds., X-ray Microscopy: Proceedings of the VI International Conference,\u00a0AIP Conference Proceedings, 507, 2000.<\/a><\/li>\n<li><strong><a href=\"https:\/\/web.archive.org\/web\/20061118085351\/http:\/\/www.esrf.fr\/conferences\/XRM2002\/index.html\" target=\"_blank\" rel=\"noreferrer noopener\">XRM2002<\/a>, Grenoble, France. 2002.<br \/>\n<\/strong>Proceedings:\u00a0<a href=\"http:\/\/jp4.journaldephysique.org\/en\/articles\/jp4\/abs\/2003\/02\/contents\/contents.html%20\" target=\"_blank\" rel=\"noreferrer noopener\">J. Susini, D. Joteux, F. Polack (Eds),\u00a0J. de Physique IV Proceedings 104 (2003)<\/a><\/li>\n<li><strong><a href=\"http:\/\/xrm2005.spring8.or.jp\/\" target=\"_blank\" rel=\"noreferrer noopener\">XRM2005<\/a>, Himeji Japan. 2005.<br \/>\n<\/strong>Proceedings: S. Aoki, Y. Kagoshima, Y. Suzuki (Eds),\u00a0IPAP Conference Series 7, Proc. 8th Int. Conf. on X-ray Microscopy<\/li>\n<li><strong><a href=\"http:\/\/xrm2008.web.psi.ch\/\" target=\"_blank\" rel=\"noreferrer noopener\">XRM2008<\/a>,\u00a0Z\u00fcrich, Switzerland. 2008<br \/>\n<\/strong>Proceedings:\u00a0<a href=\"http:\/\/iopscience.iop.org\/issue\/1742-6596\/186\/1%20\" target=\"_blank\" rel=\"noreferrer noopener\">Christoph Quitmann, Franz Pfeiffer (Eds.),\u00a0J. Physics: Conference Series: Proc. 9th Int. Conf. on X-ray Microscopy Vol 186 (2009)<\/a><\/li>\n<li><strong><a href=\"http:\/\/xrm2010.aps.anl.gov\/\" target=\"_blank\" rel=\"noreferrer noopener\">XRM2010<\/a>, Chicago, Il. 2010.<br \/>\n<\/strong>Proceedings:\u00a0<a href=\"http:\/\/scitation.aip.org\/content\/aip\/proceeding\/aipcp\/1365%20\" target=\"_blank\" rel=\"noreferrer noopener\">Ian McNulty\u00a0,\u00a0Catherine Eyberger\u00a0\u00a0and\u00a0Barry Lai\u00a0(Eds.), The 10th International Conference on X-ray Microcopy, AIP Conf. Proc.\u00a01365\u00a0(2011)<\/a><\/li>\n<li><strong><a href=\"http:\/\/xrm2012.csp.escience.cn\/\" target=\"_blank\" rel=\"noreferrer noopener\">XRM2012<\/a>, Shanghai, China. 2012.<br \/>\n<\/strong>Proceedings:\u00a0<a href=\"http:\/\/iopscience.iop.org\/issue\/1742-6596\/463\/1\" target=\"_blank\" rel=\"noreferrer noopener\">Hongjie Xu,\u00a0Ziyu Wu\u00a0and\u00a0Renzhong Tai, Eds.\u00a011th International Conference on X-ray Microscopy (XRM2012),\u00a0Journal of Physics: Conference Series,\u00a0Volume 463.<\/a><\/li>\n<li><strong><a href=\"https:\/\/web.archive.org\/web\/20160324075457\/http:\/\/xrm2014.synchrotron.org.au\/\" target=\"_blank\" rel=\"noreferrer noopener\">XRM2014<\/a>, Melbourne, Australia. 2014.<br \/>\n<\/strong>Proceedings:\u00a0<a href=\"http:\/\/scitation.aip.org\/content\/aip\/proceeding\/aipcp\/1696\" target=\"_blank\" rel=\"noreferrer noopener\">Martin D. de Jonge,\u00a0David J. Paterson and\u00a0Christopher G. Ryan, XRM 2014: Proceedings of the 12th International Conference on X-ray Microscopy,\u00a0AIP Conf. Proc.\u00a01696, (2016)<\/a><\/li>\n<li><strong><a href=\"http:\/\/xrm2016.com\/\" target=\"_blank\" rel=\"noreferrer noopener\">XRM2016<\/a>, Oxford, UK. 2016<br \/>\n<\/strong>Proceedings:\u00a0<a href=\"http:\/\/iopscience.iop.org\/issue\/1742-6596\/849\/1\">Proceedings of the 13<sup>th<\/sup>\u00a0International Conference on x-ray Microscopy, Oxford, UK, 2016 IOP Conference Series: J. Phys. Conf. Series\u00a0\u00a0849\u00a0(2017)\u00a0<\/a><\/li>\n<li><strong><a href=\"https:\/\/xrm2018.usask.ca\/\" target=\"_blank\" rel=\"noreferrer noopener\" data-type=\"URL\" data-id=\"https:\/\/xrm2018.usask.ca\/\">XRM2018<\/a>, Saskatoon, Canada. 2018<br \/>\n<\/strong>Proceedings:\u00a0<a href=\"https:\/\/www.cambridge.org\/core\/journals\/microscopy-and-microanalysis\/issue\/proceedings-of-microscopy-microanalysis-2018\/0CF4713739D6D2916625FE37A2020355\" target=\"_blank\" rel=\"noreferrer noopener\">Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018)<\/a><\/li>\n<li><strong><a href=\"https:\/\/indico.nsrrc.org.tw\/event\/4\/\" target=\"_blank\" rel=\"noreferrer noopener\">XRM2022<\/a>, Hsinchu, Taiwan, July 19-24, 2022<br \/>\n<\/strong>Proceedings:\u00a0<a href=\"https:\/\/pubs.aip.org\/aip\/acp\/issue\/2990\/1\" data-type=\"link\" data-id=\"https:\/\/pubs.aip.org\/aip\/acp\/issue\/2990\/1\">https:\/\/pubs.aip.org\/aip\/acp\/issue\/2990\/1<\/a><\/li>\n<li><strong><a href=\"https:\/\/www.xrm2024.com\/\" target=\"_blank\" rel=\"noopener\">XRM2024<\/a>, Lund, Sweden, August 12-16, 2024<br \/>\n<\/strong>Website: <a href=\"https:\/\/www.xrm2024.com\/\" target=\"_blank\" rel=\"noopener\">https:\/\/www.xrm2024.com\/<\/a><\/li>\n<\/ul>\n<\/div>[vc_custom_heading text=&#8221;Code of Conduct&#8221; font_container=&#8221;tag:h3|text_align:left&#8221; use_theme_fonts=&#8221;yes&#8221; css=&#8221;&#8221;][vc_column_text css=&#8221;&#8221;]<\/p>\n<p style=\"text-align: justify;\">All attendees, speakers, and sponsors at this event are required to agree with the following code of conduct. Organizers will enforce this code throughout the event. Creating a supportive environment to enable scientific discourse<strong>\u00a0<\/strong>is the responsibility of all participants.<\/p>\n<p style=\"text-align: justify;\">Our meeting provides a harassment-free conference experience for everyone. Participants must agree to be professional and courteous regardless of gender, age, ancestry, sexual orientation, disability, race, ethnicity, appearance, political affiliation, or religion.<\/p>\n<p style=\"text-align: justify;\">It is strictly prohibited any of the following actions during the conference:<\/p>\n<ul style=\"text-align: justify;\">\n<li>Recording, copying, or capturing any conference material presented;<\/li>\n<li>Sharing content with nonregistered users;<\/li>\n<li>The use of hostile or profane language;<\/li>\n<li>Offering or soliciting products or services in the event areas, in or outside of the virtual app, or exhibitor areas and from any attendee not designated as companies representatives.<\/li>\n<\/ul>\n<p style=\"text-align: justify;\">Violations of this code of conduct policy should be reported directly to\u00a0<a href=\"mailto:eventos@cnpem.br\">eventos@cnpem.br<\/a>\u00a0or to any staff or organizing committee member. Sanctions may range from verbal warning, to ejection from the meeting without refund or to notifying appropriate authorities. Your co-operation will help ensure an enjoyable and safe experience for everybody.<\/p>\n<p style=\"text-align: justify;\">Organizing Committee<\/p>\n<p>[\/vc_column_text][\/vc_column][\/vc_row]<\/p>\n<\/div>","protected":false},"excerpt":{"rendered":"<p>[vc_row][vc_column][vc_column_text css=&#8221;&#8221;] The International Conference on X-ray Microscopy is the central conference of its community, attracting 300 to 400 scientists, engineers, and industrialists in the field. It brings together experts in developing and using X-ray microscopes, imaging methods, and related techniques. This conference addresses the most recent advances in X-ray microscopy technology as well as&hellip;<\/p>\n","protected":false},"author":3909,"featured_media":484,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"footnotes":""},"class_list":["post-501","page","type-page","status-publish","has-post-thumbnail","hentry","description-off"],"acf":[],"_links":{"self":[{"href":"https:\/\/pages.cnpem.br\/xrm2026\/wp-json\/wp\/v2\/pages\/501","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pages.cnpem.br\/xrm2026\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/pages.cnpem.br\/xrm2026\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/pages.cnpem.br\/xrm2026\/wp-json\/wp\/v2\/users\/3909"}],"replies":[{"embeddable":true,"href":"https:\/\/pages.cnpem.br\/xrm2026\/wp-json\/wp\/v2\/comments?post=501"}],"version-history":[{"count":0,"href":"https:\/\/pages.cnpem.br\/xrm2026\/wp-json\/wp\/v2\/pages\/501\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pages.cnpem.br\/xrm2026\/wp-json\/wp\/v2\/media\/484"}],"wp:attachment":[{"href":"https:\/\/pages.cnpem.br\/xrm2026\/wp-json\/wp\/v2\/media?parent=501"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}