Title: Hyperspectral XEOL imaging at the nanoscale
Abstract: Owing to the sensitivity (i.e., signal to background ratio), temporal and spatial resolutions, pulsed synchrotron X-ray nanobeams are promising tools for correlative light and X-ray chemical analysis of functional nanodevices. However, their full potential is ultimately dictated by our ability to detect multiple property-function relationships taking place at the nanoscale in the spatial and time domains. Only a combination of high-resolution X-ray excited optical luminescence techniques can provide a comprehensive understanding of their complex functionalities. Here we describe how a multimodal hard, polarized and pulsed X-ray nanoprobe addresses fundamental questions in nanowire research about the carrier dynamics, relaxation, recombination and light polarization within single wires at the nanoscale. Selected topics ranging from cluster formation, dopant segregation, and phase separations to quantum confinement effects are investigated with sub-100 nm spatial resolution and sub-50 ps temporal resolution. This approach opens also new avenues for structural, composition and optical studies with broad applicability in materials science.